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| Title: | Frontal Semiconductor Research
|
| Author: | Oliver T Chang (ed) |
| ISBN: | 1600212107 : 9781600212109 |
| Illustrations: | tables & charts |
| Format: | Hardback |
| Size: | 180x260mm |
| Pages: | 219 |
| Weight: | .706 Kg. |
| Published: | Nova Science Publishers - November 2006 |
| List Price: | 85.99 Pounds Sterling |
| Availability: | In Print |
| Subjects: | Semi-conductors & super-conductors |
This book includes within its scope studies of the structural, electrical, optical and acoustical properties of bulk, low-dimensional and amorphous semiconductors; computational semiconductor physics; interface properties, including the physics and chemistry of heterojunctions, metal-semiconductor and insulator-semiconductor junctions; all multi-layered structures involving semiconductor components. Dopant incorporation. Growth and preparation of materials, including both epitaxial (e.g. molecular beam and chemical vapour methods) and bulk techniques; in situ monitoring of epitaxial growth processes, also included are appropriate aspects of surface science such as the influence of growth kinetics and chemical processing on layer and device properties. The physics of semiconductor electronic and optoelectronic devices are examined , including theoretical modelling and experimental demonstration; all aspects of the technology of semiconductor device and circuit fabrication. Relevant areas of 'molecular electronics' and semiconductor structures incorporating Langmuir- Blodgett films; resists, lithography and metallisation where they are concerned with the definition of small geometry structure. The structural, electrical and optical characterisation of materials and device structures are also included. The scope encompasses materials and device reliability: reliability evaluation of technologies; failure analysis and advanced analysis techniques such as SEM, E-beam, optical emission microscopy, acoustic microscopy techniques; liquid crystal techniques; noise measurement, reliability prediction and simulation; reliability indicators; failure mechanisms, including charge migration, trapping, oxide breakdown, hot carrier effects, electro-migration, stress migration; package- related failure mechanisms; effects of operational and environmental stresses on reliability.
Spectroscopy of Eu-activated Lu2O3 X-ray Phosphors; Electronic Structure and Optical Properties of AlAs/GaAs Superlattices Containing Embedded GaAs Quantum Wells with Abrupt and Graded Interfaces; Spin-Lattice Relaxation of Ammonium Ions in Solids; Amorphous Silicon-Germanium Alloys Obtained by Low Frequency Plasma Enhanced Chemical Vapour Deposition (LF-PECVD); Growth and Non-destructive Characterisation of Cd1-xZnxTe Crystals grown by a Modified Vertical Bridgman Method; Display-type Spherical Mirror Analyser for Electronic and Atomic Structure Analyses using Synchrotron Radiation; Layered Cobalt Perovskites: Current Topics and Future Promises; Index.
