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Title:New Trends & Potentialities of Tof-SIMS in Surface Studies
Author:Jacek Grams
ISBN:1600216358 : 9781600216350
Illustrations:tables & charts
Format:Hardback
Size:180x260mm
Pages:273
Weight: .822 Kg.
Published:Nova Science Publishers - September 2007
List Price: 59.5 Pounds Sterling
Availability:In Print
Subjects:Mass spectrometry


This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.

Preface; Introduction; ToF-SIMS Basics and Instrument Development; Biomaterials, Biomolecules, Biologic, Biomaterials, Biomolecules, Biological Systems and Applications in Medicine; Polymers; Investigations of other Organic Compounds; Materials Applied Materials Applied in Electronic Materials Applied in Electronic Industry; Environmental Chemistry; Inorganic Surfaces; Corrosion and Monitoring of Organic Coating Processes; Forensic Science; Catalysis; Investigations of Surface Contaminations; Other Applications; Index.